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ATE/ATMS by KeySol
At Keysol Technologies, the development of a robust and scalable Automated Test Equipment (ATE) and Automated Test Management System (ATMS) represents a significant step forward in enhancing the efficiency, repeatability, and accuracy of testing processes for RF, microwave, and other electronic systems. The in-house designed ATE/ATMS platform is tailored to meet the demanding requirements of high-performance RF systems and subsystems, ensuring compliance with industry standards while optimising production and validation cycles.
ATE/ATMS Architecture
ATE/ATMS consists of five main components:
- Hardware: including standard 19-inch rack mount servers and workstations, power supplies, PCIe backplanes and related PXI modules, interface modules, embedded controllers, analog inputs and outputs, digital input/output, and AC/DC outlets
- Software: for test development and management of data collection, storage, reporting, and analysis
- Test instruments: such as a digital storage oscilloscope (DSO), digital multimeter, or inductance, capacitance, and resistance (LCR) meter
- Signal sources: such as an arbitrary waveform generator (AWG), function generator, pulse generator, or radio frequency (RF) generator
- Test probes or handlers: which establish a connection between a test instrument and a DUT, UUT, or EUT
Objectives of ATE/ATMS
- Standardise and automate test procedures across various product lines.
- Improve test accuracy, repeatability, and reliability.
- Enable data logging, analysis, and reporting for traceability and quality assurance.
- Support modular and scalable architectures to easily integrate new test cases and hardware.
- Reduce manual intervention and human error in testing workflows.
- Enable remote access and monitoring for test operations.
1. Hardware Platform
The ATE system integrates a range of precision instrumentation and switching subsystems, including:
- Vector Network Analyzers (VNAs)
- Signal Generators and Spectrum Analyzers
- RF Switch Matrices
- Power Meters and Sensors
- DC Power Supplies and Load Banks
- Custom RF Fixtures and Interface Adapters
These components are configured into a rack-mounted test station, interfaced using GPIB, USB, LAN, PXI, or LXI protocols, depending on the instrument class.
2. Software Stack
The ATMS software is developed using modern software frameworks and languages (e.g., Python, LabVIEW, C#)
- Instrument Control Layer: Unified abstraction for controlling various vendors’ equipment (NI, Keysight, Rohde & Schwarz, etc.).
- Test Executive Layer: Manages test sequences, timing, and conditional logic.
- User Interface: Intuitive GUI for operator interaction, test selection, and result visualisation.
- Database and Reporting: SQL-based backend for storing test logs, results, and configurations with automated PDF/CSV reporting.
- Calibration & Maintenance Scheduling: Built-in modules to track calibration cycles and system health.
Tests Performed with ATE
Keysol offers completely customisable RF Automated Test Equipment (ATE) solutions for testing RF devices under test (DUTs) and validating their intended functionality. These functional test solutions provide the versatility to conduct a broad spectrum of tests, including RF frequency monitoring.
- RF Frequency measurement.
- RF Power measurement.
- RF Occupied Bandwidth (OBW)
- RF Spectrum Emission Mask.
- Packet Transmitter test
- UUT sensitivity
- Rx Audio Output test
- Audio Distortion
- Squelch Sensitivity
- Frequency stability
- Harmonic Level
- Current consumption in Tx/Rx mode
- RF Front-Ends and Transceivers
- Power Amplifiers (PA) and Low Noise Amplifiers (LNA)
- Switches, Couplers, and Filters
- Antenna Systems and Subassemblies
- Digital and Mixed-Signal Boards
- Embedded Modules (Wi-Fi, Bluetooth, GNSS, etc.)
Salient features of our RF ATE’s
Salient features of our RF ATE’s
Salient features of our RF ATE’s
- RF and Microwave Measurement Automation: Automated S-parameter sweeps, power level checks, modulation accuracy (EVM), frequency response, phase noise, and harmonic distortion measurements.
- Dynamic Test Configuration: Test plans are dynamically configurable using XML/JSON-based templates or GUI-based editors.
- Parallel and Batch Testing: Support for multi-device parallel testing, reducing overall test time for production batches.
- Remote Access and Control: Web-based dashboard and secure VPN access allow engineering teams to monitor and control tests remotely.
- Error Handling and Diagnostic Routines: Built-in self-test and fault-detection algorithms allow for rapid troubleshooting and minimal downtime.
- Compliance and Standards: Supports MIL-STD, IEEE, and ISO-compliant testing methodologies.
Salient features of our RF ATE’s
Salient features of our RF ATE’s
Outcomes and Benefits
- Reduced test time by up to 60% in production and QA processes.
- Increased first-pass yield and product reliability through standardised and validated test procedures.
- Improved traceability and audit-readiness with automated data capture and secure storage.
- Enhanced scalability, enabling rapid adaptation to new product lines and test cases.
Future Developments
- Integration with MES/ERP systems for end-to-end traceability and manufacturing intelligence.
- AI/ML-driven analytics for predictive maintenance and test result anomaly detection.
- Cloud-based test data management for collaborative engineering and big data insights.
Why KeySol Technologies?
At Keysol Technologies, we bring unmatched expertise and a solutions-driven approach to Automated Test Equipment (ATE) and Automated Test Management Systems (ATMS) development. Here's why we are the preferred partner for high-performance testing solutions:
- End-to-End Capability
- Domain Expertise
- Collaboration with Global Technology Leaders
- Custom Engineering
- Prompt Delivery & Continued Support
- Cost-Effective Innovation